EC EN 452

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Experiments in Integrated Circuit Development

Electrical and Computer Engineering Ira A. Fulton College of Engineering

Course Description

Measurements of key silicon properties and fabrication of integrated circuits.

When Taught

Fall

Min

1

Fixed

1

Fixed

0

Fixed

3

Other Prerequisites

EC En 450 or concurrent enrollment; or Ch En 481 or concurrent enrollment.

Title

Tools

Learning Outcome

Ability to use modern microelectronics fabrication equipment.

Title

Fabricated Devices

Learning Outcome

Ability to analyze and interpret data measured from fabricated devices.

Title

MOSFET Devices

Learning Outcome

Ability to design processes for fabrication of MOSFET devices.